Invention Grant
US08429570B2 Pattern recognition with edge correction for design based metrology
失效
基于设计的计量学边缘校正的模式识别
- Patent Title: Pattern recognition with edge correction for design based metrology
- Patent Title (中): 基于设计的计量学边缘校正的模式识别
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Application No.: US12914154Application Date: 2010-10-28
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Publication No.: US08429570B2Publication Date: 2013-04-23
- Inventor: Todd C. Bailey , Daniel S. Fischer , Dongbing Shao
- Applicant: Todd C. Bailey , Daniel S. Fischer , Dongbing Shao
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Ian MacKinnon
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
Exemplary embodiments include a method for edge correction in pattern recognition, the method including receiving a design layout, receiving a sample plan based on the design layout, receiving user-generated edge input and generating a recipe output from the design layout, the sample plan and the user-generated edge input. The incorporation of the edge input results in SEM recipes that are much more successful in recognizing patterns that have tendency to deviate in appearance from design by, for example, moderate to severe sidewall angle.
Public/Granted literature
- US20120110522A1 Pattern Recognition with Edge Correction for Design Based Metrology Public/Granted day:2012-05-03
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