Invention Grant
- Patent Title: Method for manufacturing a capacitive measuring apparatus
- Patent Title (中): 电容式测量装置的制造方法
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Application No.: US13120760Application Date: 2009-08-12
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Publication No.: US08434211B2Publication Date: 2013-05-07
- Inventor: Volker Dreyer , Armin Wernet
- Applicant: Volker Dreyer , Armin Wernet
- Applicant Address: DE Maulburg
- Assignee: Endress + Hauser GmbH + Co. KG
- Current Assignee: Endress + Hauser GmbH + Co. KG
- Current Assignee Address: DE Maulburg
- Agency: Bacon & Thomas, PLLC
- Priority: DE102008049623 20080930
- International Application: PCT/EP2009/060408 WO 20090812
- International Announcement: WO2010/037586 WO 20100408
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
A method for manufacturing a measuring apparatus for capacitive determining and/or monitoring of at least the fill level of a medium. The measuring apparatus has a probe unit and an electronics unit. During a measurement, the electronics unit supplies the probe unit with an exciter signal and receives from the probe unit a received signal, from which the electronics unit ascertains a capacitance value. The probe unit is coated with an insulation layer, the coated probe unit is connected with the electronics unit and inserted into a container containing a calibration medium, the coated probe unit is covered completely by the calibration medium and an associated received signal is gained, and, with the associated received signal, at least one adjustable component of the electronics unit is set.
Public/Granted literature
- US20110192017A1 METHOD FOR MANUFACTURING A CAPACITIVE MEASURING APPARATUS Public/Granted day:2011-08-11
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