Invention Grant
US08434341B2 Methods and systems for supporting a workpiece and for heat-treating the workpiece 有权
用于支撑工件和热处理工件的方法和系统

Methods and systems for supporting a workpiece and for heat-treating the workpiece
Abstract:
An apparatus for supporting a semiconductor workpiece includes a heating system configured to cause thermally-induced motion of the semiconductor workpiece by heating a surface of the workpiece relative to a bulk of the workpiece. The thermally-induced motion includes vertical motion of an outer edge region of the workpiece and a center of the workpiece relative to each other. The apparatus further includes a support system configured to allow the thermally-induced motion including the vertical motion of the outer edge region of the workpiece and the center of the workpiece relative to each other while supporting the workpiece.
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