Invention Grant
- Patent Title: High pressure high temperature linear swell meter
- Patent Title (中): 高压高温线性膨胀计
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Application No.: US12807406Application Date: 2010-09-03
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Publication No.: US08434355B1Publication Date: 2013-05-07
- Inventor: Hongfeng Bi
- Applicant: Hongfeng Bi
- Main IPC: E21B49/00
- IPC: E21B49/00 ; G01N15/08

Abstract:
A method and apparatus for monitoring swelling changes consists of a cylindrical cell assembly (80) capable of withstanding high pressure and high temperature with a wafer holder (48) containing a wafer (42) of solid sample. A sensor rod (56) moves in response to expansion or contraction of the sample wafer (42) and its movement is measured by either an LVDT sensor (66) or a magnetometer (116). Heat is provided via a heater (30) and pressure is controlled via a pressurization inlet (16) or pressurization fluid (68).
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