Invention Grant
- Patent Title: Bonding apparatus and bonding method
- Patent Title (中): 接合装置和接合方法
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Application No.: US13284434Application Date: 2011-10-28
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Publication No.: US08434538B2Publication Date: 2013-05-07
- Inventor: Naoki Akiyama , Masahiko Sugiyama , Yosuke Omori
- Applicant: Naoki Akiyama , Masahiko Sugiyama , Yosuke Omori
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer
- Priority: JP2010-243516 20101029
- Main IPC: B32B37/00
- IPC: B32B37/00

Abstract:
A bonding apparatus has an upper chuck and a lower chuck for holding wafers. The upper chuck is configured such that the center portion is bent to be convex when pressurized with a predetermined pressure. On the bottom surface of the lower chuck, there is an insulating ring formed of a combination of a plurality of insulating members to support the periphery of the lower chuck. The bottom surface of the insulating ring is supported by a support ring formed of a combination of a plurality of supporting members. The supporting members and the lower chuck are fixed by a bolt provided for each of the supporting members. The bolt is inserted through a through hole and a through hole which are formed in the insulating members and the supporting members, respectively, the through holes having a diameter larger than a diameter of the bolt.
Public/Granted literature
- US20120103533A1 BONDING APPARATUS AND BONDING METHOD Public/Granted day:2012-05-03
Information query