Invention Grant
- Patent Title: Monitoring a temperature and/or temperature related parameters of an optical element
- Patent Title (中): 监测光学元件的温度和/或温度相关参数
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Application No.: US12645705Application Date: 2009-12-23
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Publication No.: US08434938B2Publication Date: 2013-05-07
- Inventor: Joachim Schulz
- Applicant: Joachim Schulz
- Applicant Address: DE Ditzingen
- Assignee: Trumpf Laser-und Systemtechnik GmbH
- Current Assignee: Trumpf Laser-und Systemtechnik GmbH
- Current Assignee Address: DE Ditzingen
- Agency: Fish & Richardson P.C.
- Priority: DE102007030398 20070629
- Main IPC: G01J5/00
- IPC: G01J5/00 ; G01N25/20

Abstract:
An apparatus for monitoring a temperature and/or a temperature-dependent parameter of an optical element arranged in a path of a laser beam includes a measuring light source to produce measuring radiation and direct the measuring radiation to the optical element, a detector arranged to detect a portion of the measuring radiation that has passed through a passage region of the optical element, an evaluating device connected to the detector to monitor the temperature and/or the temperature-dependent parameter. The evaluating device is configured to determine the temperature and/or the temperature-dependent parameter based on an intensity of the measuring radiation detected by the detector in the passage region.
Public/Granted literature
- US20100135356A1 Monitoring a temperature and/or temperature related parameters of an optical element Public/Granted day:2010-06-03
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