Invention Grant
- Patent Title: Machining information supply equipment and supply system
- Patent Title (中): 加工信息供应设备和供应系统
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Application No.: US12669230Application Date: 2008-07-04
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Publication No.: US08436273B2Publication Date: 2013-05-07
- Inventor: Takeshi Sakamoto
- Applicant: Takeshi Sakamoto
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: Hamamatsu Photonics K.K.
- Current Assignee: Hamamatsu Photonics K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2007-187292 20070718
- International Application: PCT/JP2008/062208 WO 20080704
- International Announcement: WO2009/011238 WO 20090122
- Main IPC: B23K26/04
- IPC: B23K26/04 ; B23K26/42 ; G06F19/00

Abstract:
A processing information supply apparatus 10 is prepared for a laser processing apparatus for forming a modified region, which becomes a starting point of cutting, along a line to cut within an object to be processed by irradiating the object with laser light while locating a light-converging point within the object. The processing information supply apparatus 10 includes an object information input unit 12 for inputting processing object information on the object to be processed, a processing condition database 19 in which data on processing conditions corresponding to the processing object information is accumulated, a processing condition setting unit 16 for referring to the processing condition data in the database 19 and setting the processing condition for the object based on the processing object information, and a condition information output unit 13 for outputting processing condition information for the set processing condition. Thus, the processing information supply apparatus and the supply system capable of favorably acquiring the processing information applied to the laser processing apparatus at a processing worker side are realized.
Public/Granted literature
- US20100258539A1 MACHINING INFORMATION SUPPLY EQUIPMENT AND SUPPLY SYSTEM Public/Granted day:2010-10-14
Information query
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