Invention Grant
US08436287B2 System and/or method for reading, measuring and/or controlling intensity of light emitted from an LED
有权
用于读取,测量和/或控制从LED发射的光的强度的系统和/或方法
- Patent Title: System and/or method for reading, measuring and/or controlling intensity of light emitted from an LED
- Patent Title (中): 用于读取,测量和/或控制从LED发射的光的强度的系统和/或方法
-
Application No.: US12807531Application Date: 2010-09-09
-
Publication No.: US08436287B2Publication Date: 2013-05-07
- Inventor: Bradley W. Engstrand
- Applicant: Bradley W. Engstrand
- Applicant Address: US WI Hartford
- Assignee: Phaedrus, LLC
- Current Assignee: Phaedrus, LLC
- Current Assignee Address: US WI Hartford
- Agency: Patents & TMS, P.C.
- Main IPC: G01J1/32
- IPC: G01J1/32 ; H01J40/14 ; F21V15/00

Abstract:
A system and/or a method read, measure and/or control intensity of light emitted from a light-emitting diode (LED). A light detector may be located in a position adjacent to the LED for reading and/or measuring the intensity of light emitted from the LED. The LED and the light detector may be located in a cavity which may limit exposure of the LED and the light detector to ambient light. The cavity may have an aperture for allowing light emitted from the LED to exit the chamber to illuminate an environment in which the chamber is located. The aperture may be located between the cavity and a compartment, and the LED may emit light through the aperture into the compartment. An additional detector may be located in the compartment and/or may extend from the cavity through an additional aperture into the compartment.
Public/Granted literature
- US20110001035A1 System and/or method for reading, measuring and/or controlling intensity of light emitted from an LED Public/Granted day:2011-01-06
Information query
IPC分类: