Invention Grant
- Patent Title: DOI type radiation detector
- Patent Title (中): DOI型辐射探测器
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Application No.: US12999041Application Date: 2008-10-08
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Publication No.: US08436312B2Publication Date: 2013-05-07
- Inventor: Naoko Inadama , Hideo Murayama , Kengo Shibuya , Fumihiko Nishikido , Taiga Yamaya , Eiji Yoshida
- Applicant: Naoko Inadama , Hideo Murayama , Kengo Shibuya , Fumihiko Nishikido , Taiga Yamaya , Eiji Yoshida
- Applicant Address: JP Chiba
- Assignee: National Institute of Radiological Sciences
- Current Assignee: National Institute of Radiological Sciences
- Current Assignee Address: JP Chiba
- Agency: Oliff & Berridge, PLC
- International Application: PCT/JP2008/068279 WO 20081008
- International Announcement: WO2010/041313 WO 20100415
- Main IPC: G01T1/20
- IPC: G01T1/20

Abstract:
This aims to provide a DOI type radiation detector in which scintillation crystals arranged two-dimensionally on a light receiving surface to form rectangular section groups in extending directions of the light receiving surface of a light receiving element are stacked up to make a three-dimensional arrangement and responses of the crystals that have detected radiation are made possible to identify at response positions on the light receiving surface, so that a three-dimensional radiation detection position can be obtained. In the DOI type radiation detector, scintillation crystals are right triangle poles extending upwards from the light receiving surface and the response positions on the light receiving surface are characterized. With this structure, DOI identification of a plurality of layers can be carried out by simply performing an Anger calculation of a light receiving element signal.
Public/Granted literature
- US20110101229A1 DOI TYPE RADIATION DETECTOR Public/Granted day:2011-05-05
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