Invention Grant
- Patent Title: Particle beam irradiation apparatus and particle beam irradiation method
- Patent Title (中): 粒子束照射装置和粒子束照射方法
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Application No.: US12677677Application Date: 2008-09-12
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Publication No.: US08436323B2Publication Date: 2013-05-07
- Inventor: Yasushi Iseki , Katsushi Hanawa
- Applicant: Yasushi Iseki , Katsushi Hanawa
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2007-236399 20070912
- International Application: PCT/JP2008/066542 WO 20080912
- International Announcement: WO2009/035080 WO 20090319
- Main IPC: A61N5/10
- IPC: A61N5/10

Abstract:
A particle beam irradiation apparatus includes: a beam generation unit that generates a particle beam; a beam emission control unit that controls emission of the particle beam; a beam scanning instruction unit that sequentially two-dimensionally instructs a position of the particle beam so that the particle beam is scanned across the entire slice; a beam scanning unit that two-dimensionally scans the particle beam; a respiration gate generation unit that generates a respiration gate synchronized with a respiration cycle of the patient; and a pulse generation unit that generates a predetermined number of scanning start pulses at substantially equally spaced time intervals in the respiration gate. The beam scanning instruction unit instructs to scan the entire slice by pattern irradiation based on a set dose from each of the scanning start pulses so that a scan of the same slice is repeated the predetermined number of times.
Public/Granted literature
- US20100187435A1 PARTICLE BEAM IRRADIATION APPARATUS AND PARTICLE BEAM IRRADIATION METHOD Public/Granted day:2010-07-29
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