Invention Grant
- Patent Title: Eddy current inspection system and method
- Patent Title (中): 涡流检测系统及方法
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Application No.: US12563403Application Date: 2009-09-21
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Publication No.: US08436608B2Publication Date: 2013-05-07
- Inventor: Haiyan Sun , Yuri Alexeyevich Plotnikov , Changting Wang , Shridhar Champaknath Nath , Aparna Chakrapani Sheila-Vadde
- Applicant: Haiyan Sun , Yuri Alexeyevich Plotnikov , Changting Wang , Shridhar Champaknath Nath , Aparna Chakrapani Sheila-Vadde
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Penny A. Clarke
- Main IPC: G01N27/82
- IPC: G01N27/82 ; G01R33/14 ; G01R33/00

Abstract:
A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented.
Public/Granted literature
- US20110068784A1 EDDY CURRENT INSPECTION SYSTEM AND METHOD Public/Granted day:2011-03-24
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