An example method includes measuring a capacitance variation of a first conductive element and a capacitance variation of a second conductive element. The example method includes calculating a centroid position through the measured capacitance variation of the first conductive element and the measured capacitance variation of the second conductive element. A conductive sub-element of the first conductive element may be interleaved with a conductive sub-element of the second conductive element. The conductive sub-element of the first conductive element and the conductive sub-element of the second conductive element may each have a varying width.