Invention Grant
- Patent Title: Method and apparatus of tilted illumination observation
- Patent Title (中): 倾斜照明观察的方法和装置
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Application No.: US12535021Application Date: 2009-08-04
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Publication No.: US08436899B2Publication Date: 2013-05-07
- Inventor: Takeshi Kawasaki , Tomonori Nakano , Kotoko Hirose
- Applicant: Takeshi Kawasaki , Tomonori Nakano , Kotoko Hirose
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2008-203196 20080806
- Main IPC: H04N7/18
- IPC: H04N7/18

Abstract:
A tilted illumination observation method and observation device with easy adjustment, high speed, good reproducibility and low cost is provided. A high resolution tilt image of a specimen is obtained by extracting the blurring on the scanning spot occurring during beam tilt from the image (step 6) captured by the tilted beam, and the image (step 4) captured from directly above the standard specimen; and then deconvoluting (step 11, 12) the tilted image of the target specimen (step 10) using the extracted scanning spot from the oblique beam.
Public/Granted literature
- US20100033560A1 Method and Apparatus of Tilted Illumination Observation Public/Granted day:2010-02-11
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