Invention Grant
- Patent Title: Lithographic apparatus and method of irradiating at least two target portions
- Patent Title (中): 光刻设备和照射至少两个目标部分的方法
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Application No.: US12639744Application Date: 2009-12-16
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Publication No.: US08436984B2Publication Date: 2013-05-07
- Inventor: Cornelis Lambertus Maria Van Weert , Marcus Adrianus Van De Kerkhof , Bearrach Moest
- Applicant: Cornelis Lambertus Maria Van Weert , Marcus Adrianus Van De Kerkhof , Bearrach Moest
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: G03B27/72
- IPC: G03B27/72 ; G03B27/32

Abstract:
A lithographic apparatus is disclosed that includes a table, at least two target portions on the table or on an object on the table, and a surface material between the at least two target portions. The apparatus further includes an optical system configured to project a beam of radiation, along an optical path towards the table, with a cross-section to irradiate the at least two target portions at the same time. The apparatus further includes a shield moveable into the optical path to restrict the cross-section of the beam of radiation to restrict illumination between the at least two target portions, wherein the surface material between the at least two target portions would degrade when irradiated with radiation from the optical system.
Public/Granted literature
- US20100157271A1 LITHOGRAPHIC APPARATUS AND METHOD OF IRRADIATING AT LEAST TWO TARGET PORTIONS Public/Granted day:2010-06-24
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