Invention Grant
- Patent Title: Apparatus for measuring data setup/hold time
- Patent Title (中): 用于测量数据设置/保持时间的设备
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Application No.: US13346308Application Date: 2012-01-09
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Publication No.: US08437207B2Publication Date: 2013-05-07
- Inventor: Chang Ki Baek
- Applicant: Chang Ki Baek
- Applicant Address: KR Icheon-si
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Icheon-si
- Agency: Cooper & Dunham LLP
- Agent John P. White
- Priority: KR10-2008-0061905 20080627
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
An apparatus for measuring data setup/hold time is capable of effectively measuring a setup/hold time of data, and includes a data generating unit for delaying an external clock signal according to counting signals and generating an internal clock signal and data signals from the delayed external clock signal in response to test signals, a flag signal generating unit for generating flag signals according to the internal clock signal and the data signals, and a counter for producing the counting signals in response to the flag signals.
Public/Granted literature
- US20120106266A1 Apparatus For Measuring Data Setup/Hold Time Public/Granted day:2012-05-03
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