Invention Grant
- Patent Title: Laminography system
- Patent Title (中): Laminography系统
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Application No.: US13041487Application Date: 2011-03-07
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Publication No.: US08437447B2Publication Date: 2013-05-07
- Inventor: Martin Muenker
- Applicant: Martin Muenker
- Applicant Address: DE Hamburg
- Assignee: YXLON International GmbH
- Current Assignee: YXLON International GmbH
- Current Assignee Address: DE Hamburg
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: DE102010010723 20100309
- Main IPC: A61B6/00
- IPC: A61B6/00

Abstract:
A laminography system includes a first linear guide defining a z-direction of a Cartesian coordinate system and an imaging radiation source fixable to the first linear guide and movable along the first linear guide. The radiation source is configured to form a cone of rays including a central ray defining a y-axis of the Cartesian coordinate system. A detector is disposed in a position so as to be struck at a center thereof by the central ray of the radiation source substantially in an x-direction of the Cartesian coordinate system. The system also includes a first rotation device configured to rotate the detector about a first axis of rotation that is parallel to a z-axis of the Cartesian coordinate system and that passes through an intersection of the central array and the detector. The detector is fixable to a second linear guide and is movable on the second linear guide along the first axis of rotation. An object slide is disposed between the radiation source and the detector. The object slide is configured to receive an object for inspection and is rotatable by a second rotation device about a second axis of rotation that is parallel to the first axis of rotation and that passes through an intersection of the central ray and the object for inspection.
Public/Granted literature
- US20110222650A1 LAMINOGRAPHY SYSTEM Public/Granted day:2011-09-15
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