Invention Grant
US08438432B2 DRAM memory controller with built-in self test and methods for use therewith
有权
具有内置自检功能的DRAM内存控制器及其使用方法
- Patent Title: DRAM memory controller with built-in self test and methods for use therewith
- Patent Title (中): 具有内置自检功能的DRAM内存控制器及其使用方法
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Application No.: US12868648Application Date: 2010-08-25
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Publication No.: US08438432B2Publication Date: 2013-05-07
- Inventor: Rajat Gupta , Chun-Chin Yeh
- Applicant: Rajat Gupta , Chun-Chin Yeh
- Applicant Address: CA Toronto, Ontario
- Assignee: ViXS Systems, Inc.
- Current Assignee: ViXS Systems, Inc.
- Current Assignee Address: CA Toronto, Ontario
- Agency: Garlick & Markison
- Agent Bruce E. Stuckman
- Main IPC: G01R31/3181
- IPC: G01R31/3181
Abstract:
An integrated circuit is interfaced with at least one dynamic random access memory (DRAM) via a memory interface. A plurality of user test options are received. The testing of the memory interface is controlled in accordance with the plurality of user test options. Test data, generated as a result of the testing of the memory interface, is stored.
Public/Granted literature
- US20120054566A1 DRAM MEMORY CONTROLLER WITH BUILT-IN SELF TEST AND METHODS FOR USE THEREWITH Public/Granted day:2012-03-01
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