Invention Grant
- Patent Title: Method and apparatus for testing a data processing system
- Patent Title (中): 用于测试数据处理系统的方法和装置
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Application No.: US12748108Application Date: 2010-03-26
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Publication No.: US08438442B2Publication Date: 2013-05-07
- Inventor: Gary R. Morrison
- Applicant: Gary R. Morrison
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Joanna G. Chiu; David G. Dolezal
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/00 ; G06F11/00 ; G06F13/24 ; G06F13/00

Abstract:
A method of testing a processing includes performing a test of at least one logic block of a processor of a data processing system; receiving an interrupt; stopping the performing the test for the processor to respond to the interrupt, wherein the stopping the performing the test includes storing test data of the test to a memory prior to the processor responding to the interrupt; and after the processor responds to the interrupt, resuming performing the test, wherein the resuming performing the test includes retrieving the test data from the memory and using the retrieved test data for the resuming performing the test.
Public/Granted literature
- US20110239070A1 METHOD AND APPARATUS FOR TESTING A DATA PROCESSING SYSTEM Public/Granted day:2011-09-29
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