Invention Grant
US08440488B2 Manufacturing method and structure for wafer level image sensor module with fixed focal length
有权
具有固定焦距的晶片级图像传感器模块的制造方法和结构
- Patent Title: Manufacturing method and structure for wafer level image sensor module with fixed focal length
- Patent Title (中): 具有固定焦距的晶片级图像传感器模块的制造方法和结构
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Application No.: US12948020Application Date: 2010-11-17
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Publication No.: US08440488B2Publication Date: 2013-05-14
- Inventor: Hsiu-Wen Tu , Han-Hsing Chen , Chung-Hsien Hsin , Ming-Hui Chen
- Applicant: Hsiu-Wen Tu , Han-Hsing Chen , Chung-Hsien Hsin , Ming-Hui Chen
- Applicant Address: TW Hsin-Chu Hsien
- Assignee: Kingpak Technology Inc.
- Current Assignee: Kingpak Technology Inc.
- Current Assignee Address: TW Hsin-Chu Hsien
- Agent Juan Carlos A. Marquez
- Priority: TW99115729A 20100517
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
This present invention discloses a manufacturing method and structure for a wafer level image sensor module with fixed focal length. The method includes the following steps. First, a silicon wafer comprising several image sensor chips having a photosensitive area and a lens module array wafer comprising several wafer level lens modules with fixed focal length are provided. Next, the image sensor chips and the wafer level lens modules are sorted in grades according to the different quality grades. According to the sorting results, each of the wafer level lens modules is assigned to be situated above the image sensor chip that has the same grade. At the same time, each of the wafer level lens modules is directed to face the photosensitive area of each image sensor chip. Finally, in the packaging process, the wafer level lens module is surrounded by an encapsulation material.
Public/Granted literature
- US20110279815A1 MANUFACTURING METHOD AND STRUCTURE FOR WAFER LEVEL IMAGE SENSOR MODULE WITH FIXED FOCAL LENGTH Public/Granted day:2011-11-17
Information query
IPC分类: