Invention Grant
- Patent Title: Heat treatment apparatus, heat treatment method and method for manufacturing semiconductor device
- Patent Title (中): 热处理装置,热处理方法以及半导体装置的制造方法
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Application No.: US12888627Application Date: 2010-09-23
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Publication No.: US08440941B2Publication Date: 2013-05-14
- Inventor: Akihiro Narita , Hideto Ohnuma , Tomoaki Moriwaka , Shunpei Yamazaki
- Applicant: Akihiro Narita , Hideto Ohnuma , Tomoaki Moriwaka , Shunpei Yamazaki
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Priority: JP2009-219305 20090924
- Main IPC: F27D11/00
- IPC: F27D11/00 ; B23K1/005 ; H05B37/02 ; H01L21/00

Abstract:
Provided is a heat treatment apparatus in which a large-sized substrate can be rapidly heated and rapidly cooled with high uniformity, and a heat treatment method using the heat treatment apparatus. The heat treatment apparatus includes: a first chamber of which one side is opened; a second chamber of which one side is opened; a device for moving the first and the second chambers; a heating device; a gas introduction port; a gas exhaust port; and a jig for longitudinally fixing a substrate, in which the substrate is rapidly heated while the first and the second chambers are connected, and rapidly cooled by separating the chambers to move the substrate away from a heat storage portion of the heating device or the like. Further, the heat treatment method includes the heat treatment apparatus, and a method for manufacturing a semiconductor device using an oxide semiconductor is included.
Public/Granted literature
- US20110070692A1 HEAT TREATMENT APPARATUS, HEAT TREATMENT METHOD AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE Public/Granted day:2011-03-24
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