Invention Grant
US08440986B2 On axis sample visualization along a synchrontron photo beam 有权
沿轴向样品可视化沿同步照相光束

On axis sample visualization along a synchrontron photo beam
Abstract:
The present invention provides a method for on-axis visualization of a target placed in a photon beam, the method comprising: placing the target in the path of the photon beam; selecting a mirror with an external reflecting surface; placing the mirror on a mirror support so that the surface faces the target; placing a reflective microscope so as to collect photons emanating from the target that have been reflected by said surface; counting and analyzing photons collected by the microscope with a CCD camera; and storing and analyzing data collected by the camera.
Public/Granted literature
Information query
Patent Agency Ranking
0/0