Invention Grant
- Patent Title: On axis sample visualization along a synchrontron photo beam
- Patent Title (中): 沿轴向样品可视化沿同步照相光束
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Application No.: US12766275Application Date: 2010-04-23
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Publication No.: US08440986B2Publication Date: 2013-05-14
- Inventor: Kazimierz Gofron , Michael Molitsky
- Applicant: Kazimierz Gofron , Michael Molitsky
- Applicant Address: US IL Chicago
- Assignee: UChicago Argonne, LLC.
- Current Assignee: UChicago Argonne, LLC.
- Current Assignee Address: US IL Chicago
- Agency: Cherskov Flaynik & Gurda, LLC.
- Main IPC: G01N21/64
- IPC: G01N21/64

Abstract:
The present invention provides a method for on-axis visualization of a target placed in a photon beam, the method comprising: placing the target in the path of the photon beam; selecting a mirror with an external reflecting surface; placing the mirror on a mirror support so that the surface faces the target; placing a reflective microscope so as to collect photons emanating from the target that have been reflected by said surface; counting and analyzing photons collected by the microscope with a CCD camera; and storing and analyzing data collected by the camera.
Public/Granted literature
- US20110260064A1 ON AXIS SAMPLE VISUALIZATION ALONG A SYNCHRONTRON PHOTO BEAM Public/Granted day:2011-10-27
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