Invention Grant
US08441001B2 Photodetector, flat X-ray detector and method for producing the same
有权
光电检测器,平板X射线检测器及其制造方法
- Patent Title: Photodetector, flat X-ray detector and method for producing the same
- Patent Title (中): 光电检测器,平板X射线检测器及其制造方法
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Application No.: US12063055Application Date: 2006-08-04
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Publication No.: US08441001B2Publication Date: 2013-05-14
- Inventor: Jens Fürst , Debora Henseler , Georg Wittmann
- Applicant: Jens Fürst , Debora Henseler , Georg Wittmann
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Schiff Hardin LLP
- International Application: PCT/EP2006/065079 WO 20060804
- International Announcement: WO2007/017474 WO 20070215
- Main IPC: H01L51/42
- IPC: H01L51/42 ; H01L51/44

Abstract:
A flat organic photodetector has a structured first electrode that forms several sub-electrodes, a second electrode, at least one first organic layer, and a second organic layer. The organic layers are situated between the two electrodes and are structured in conformity with the structuring of the first electrode, so that the two organic layers are subdivided into multiple active regions respectively corresponding to the sub-electrodes of the first electrode. An x-ray detector has such a flat organic photodetector and an x-ray absorbing layer applied thereon.
Public/Granted literature
- US20100148072A1 PHOTODETECTOR, FLAT X-RAY DETECTOR AND METHOD FOR PRODUCING THE SAME Public/Granted day:2010-06-17
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