Invention Grant
- Patent Title: Multilayer bispectral photodiode detector
- Patent Title (中): 多层双光谱探测器
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Application No.: US13220340Application Date: 2011-08-29
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Publication No.: US08441089B2Publication Date: 2013-05-14
- Inventor: Olivier Gravrand , Jacques Baylet
- Applicant: Olivier Gravrand , Jacques Baylet
- Applicant Address: FR Paris
- Assignee: Commissariat a l′Energie Atomique et Aux Energies Alternatives
- Current Assignee: Commissariat a l′Energie Atomique et Aux Energies Alternatives
- Current Assignee Address: FR Paris
- Agency: Harris Beach PLLC
- Priority: FR1057392 20100916
- Main IPC: H01L31/102
- IPC: H01L31/102

Abstract:
This bispectral detector comprises a plurality of unitary elements for detecting a first and a second electromagnetic radiation range, consisting of a stack of upper and lower semiconductor layers of a first conductivity type which are separated by an intermediate layer that forms a potential barrier between the upper and lower layers; and for each unitary detection element, two upper and lower semiconductor zones of a second conductivity type opposite to the first conductivity type, are arranged respectively so that they are in contact with the upper faces of the upper and lower layers so as to form PN junctions, the semiconductor zone being positioned, at least partially, in the bottom of an opening that passes through the upper and intermediate layers. The upper face of at least one of the upper and lower layers is entirely covered in a semiconductor layer of the second conductivity type. Cuts are made around each unitary detection element from the upper face of the stack and at least through the thickness of each semiconductor layer of the second conductivity type, entirely covering one or other of the upper and lower semiconductor layers of the first conductivity type, so as to form semiconductor zones of the second conductivity type.
Public/Granted literature
- US20120068295A1 MULTILAYER BISPECTRAL PHOTODIODE DETECTOR Public/Granted day:2012-03-22
Information query
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