Invention Grant
- Patent Title: Rotational angle measurement apparatus
- Patent Title (中): 旋转角度测量装置
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Application No.: US12946914Application Date: 2010-11-16
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Publication No.: US08441252B2Publication Date: 2013-05-14
- Inventor: Mutsumi Suzuki
- Applicant: Mutsumi Suzuki
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2009-261472 20091117
- Main IPC: G01R33/06
- IPC: G01R33/06

Abstract:
The object of the invention is to provide a rotational angle measurement apparatus that is capable of correcting an error due to pin-angle error with a small amount of calculation operation. The rotational angle measurement apparatus includes a magnetic sensor 301 and a signal processing unit 303M. The magnetic sensor includes two bridges comprising magneto-resistance elements each having a pinned magnetic layer. A ratio-calculation unit 381 of the signal processing unit 303M calculates a ratio Vy/Vx of output signals Vx and Vy. A parameter correction unit 382 subtracts a predetermined correction parameter β from the ratio Vy/Vx calculated by the ratio-calculation unit. An a tan-processing unit 383 conducts arctangent processing on the value calculated by the parameter correction unit and calculates an angle of magnetic field θ.
Public/Granted literature
- US20110115477A1 ROTATIONAL ANGLE MEASUREMENT APPARATUS Public/Granted day:2011-05-19
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