Invention Grant
- Patent Title: Apparatus and method for screening electrolytic capacitors
- Patent Title (中): 电解电容器的筛选方法
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Application No.: US12751107Application Date: 2010-03-31
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Publication No.: US08441265B2Publication Date: 2013-05-14
- Inventor: Jonathan Paulsen , Erik Reed , Yuri Freeman
- Applicant: Jonathan Paulsen , Erik Reed , Yuri Freeman
- Applicant Address: US SC Simpsonville
- Assignee: Kemet Electronics Corporation
- Current Assignee: Kemet Electronics Corporation
- Current Assignee Address: US SC Simpsonville
- Agency: Perkins Law Firm, LLC
- Agent Joseph T. Guy
- Main IPC: G01R31/12
- IPC: G01R31/12

Abstract:
A method for screening electrolytic capacitors places a capacitor in series with a resistor, applying a test voltage and following the charge curve for the capacitor. A high voltage drop across the capacitor indicates high reliability and a low voltage drop is used to reject the piece. The leakage current is not adversely affected during the test.
Public/Granted literature
- US20100188099A1 APPARATUS AND METHOD FOR SCREENING ELECTROLYTIC CAPACITORS Public/Granted day:2010-07-29
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