Invention Grant
- Patent Title: Testing card and testing system for USB port
- Patent Title (中): USB端口测试卡和测试系统
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Application No.: US12947834Application Date: 2010-11-17
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Publication No.: US08441273B2Publication Date: 2013-05-14
- Inventor: Jia Shen , Yi-Xiao Yu , Tai-Chen Wang
- Applicant: Jia Shen , Yi-Xiao Yu , Tai-Chen Wang
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN201010236802 20100726
- Main IPC: G01R31/00
- IPC: G01R31/00
Abstract:
A testing card for a USB port includes first USB contacting pins, a second USB contacting pin, a transmitting circuits, a voltage converting circuit, and a testing portion. The first USB contacting pins are connected to the USB port to receive a number of USB signals. The second USB contacting pin is connected to the USB port to receive a voltage signal from the USB port. The transmitting circuit is electrically connected to the first USB contacting pins to transmit the USB signals therefrom. The voltage converting circuit is electrically connected to the second USB contacting pin to convert the voltage signal to a predetermined level. The testing portion is electrically connected to the outputs of the transmitting circuit and the voltage converting circuit to receive the USB signals and the converted voltage signal.
Public/Granted literature
- US20120019278A1 TESTING CARD AND TESTING SYSTEM FOR USB PORT Public/Granted day:2012-01-26
Information query
