Invention Grant
US08441279B2 Scan flip-flop circuits and scan test circuits including the same
有权
扫描触发器电路和扫描测试电路,包括它们
- Patent Title: Scan flip-flop circuits and scan test circuits including the same
- Patent Title (中): 扫描触发器电路和扫描测试电路,包括它们
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Application No.: US13154731Application Date: 2011-06-07
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Publication No.: US08441279B2Publication Date: 2013-05-14
- Inventor: Hoi-Jin Lee , Bai-Sun Kong
- Applicant: Hoi-Jin Lee , Bai-Sun Kong
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2010-0055006 20100610
- Main IPC: H03K19/003
- IPC: H03K19/003

Abstract:
A scan flip-flop circuit includes an input unit and an output unit. The input unit selects one of a data input signal and a scan input signal depending on an operation mode and generates an intermediate signal based on the selected signal. The output unit generates an output signal based on the intermediate signal and selects one of a data output terminal and a scan output terminal depending on the operation mode to provide the output signal through the selected output terminal. A voltage level at the selected output terminal bidirectionally transitions between a first voltage level and a second voltage level. A voltage level at a non-selected output terminal unidirectionally transitions between the first voltage level and the second voltage level.
Public/Granted literature
- US20110304353A1 Scan Flip-Flop Circuits And Scan Test Circuits Including The Same Public/Granted day:2011-12-15
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