Invention Grant
- Patent Title: Timing generator and test apparatus
- Patent Title (中): 定时发生器和测试仪器
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Application No.: US13253972Application Date: 2011-10-06
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Publication No.: US08441296B2Publication Date: 2013-05-14
- Inventor: Masakatsu Suda
- Applicant: Masakatsu Suda
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Ryuka
- Main IPC: G06F1/04
- IPC: G06F1/04

Abstract:
A timing generator that outputs a timing signal obtained by delaying an input signal, comprising first and second period delay sections that each output a rate signal obtained by delaying the input signal by a delay amount corresponding to an integer multiple of a period of an operation clock supplied thereto; a first high-accuracy delay section that outputs the timing signal obtained by delaying a signal input thereto by a delay amount that is less than the period of the operation clock; and a mode switching section that switches between a low-speed mode, in which the rate signal output by the first period delay section is input to the first high-accuracy delay section, and a high-speed mode, in which a signal obtained by interleaving the rate signals output by the first period delay section and the second period delay section is input to the first high-accuracy delay section.
Public/Granted literature
- US20120262215A1 TIMING GENERATOR AND TEST APPARATUS Public/Granted day:2012-10-18
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