Invention Grant
- Patent Title: Apparatus for inspecting an illumination device
- Patent Title (中): 用于检查照明装置的装置
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Application No.: US13325095Application Date: 2011-12-14
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Publication No.: US08441628B2Publication Date: 2013-05-14
- Inventor: Junichi Mitsuhashi
- Applicant: Junichi Mitsuhashi
- Applicant Address: JP Chiba
- Assignee: Hitachi Displays, Ltd.
- Current Assignee: Hitachi Displays, Ltd.
- Current Assignee Address: JP Chiba
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2010-278267 20101214
- Main IPC: G01N21/89
- IPC: G01N21/89

Abstract:
The present invention provides an apparatus for inspecting an illumination device where the illumination device allows light from one or more light sources to be emitted to the outside through a number of optical sheets layered on top of each other. The apparatus is provided with: a work stage on which an illumination device is placed; a work frame for fixing the position of the illumination device placed on the work stage; and a pressure reducing apparatus for making the pressure in the space inside the illumination device lower than the pressure in the space outside the apparatus for inspecting an illumination device when turned on during the inspection, wherein the work frame has an opening through which light from the illumination device is emitted and makes contact with the outer periphery of the illumination device and the work stage, respectively, through annular form during the inspection.
Public/Granted literature
- US20120147365A1 Apparatus for Inspecting an Illumination Device Public/Granted day:2012-06-14
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