Invention Grant
- Patent Title: Manufacturing and testing techniques for electronic displays
- Patent Title (中): 电子显示器的制造和测试技术
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Application No.: US12835431Application Date: 2010-07-13
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Publication No.: US08441643B2Publication Date: 2013-05-14
- Inventor: Moo Kyung Son , Victor Hao-En Yin , John Z. Zhong , Wei Chen
- Applicant: Moo Kyung Son , Victor Hao-En Yin , John Z. Zhong , Wei Chen
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agent David C. Kellogg
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A method for testing photosensitivity of an electronic display module, such as a liquid crystal display module, is provided. In one embodiment, a method includes exposing a display module to light at a first intensity and measuring an amount of light transmitted through the display module. The method may also include exposing the display module to light at a second intensity and measuring an amount of that light transmitted through the display module. The measured amounts may then be compared to determine an optical property, such as photosensitivity, of the display panel. Various other methods, systems, and manufactures are also disclosed.
Public/Granted literature
- US20120013819A1 MANUFACTURING AND TESTING TECHNIQUES FOR ELECTRONIC DISPLAYS Public/Granted day:2012-01-19
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