Invention Grant
- Patent Title: Variable resistance nonvolatile memory device
- Patent Title (中): 可变电阻非易失性存储器件
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Application No.: US13054312Application Date: 2010-04-14
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Publication No.: US08441837B2Publication Date: 2013-05-14
- Inventor: Yuuichirou Ikeda , Kazuhiko Shimakawa , Yoshihiko Kanzawa , Shunsaku Muraoka , Ryotaro Azuma
- Applicant: Yuuichirou Ikeda , Kazuhiko Shimakawa , Yoshihiko Kanzawa , Shunsaku Muraoka , Ryotaro Azuma
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2009-099325 20090415
- International Application: PCT/JP2010/002683 WO 20100414
- International Announcement: WO2010/119671 WO 20101021
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A nonvolatile resistance variable memory device (100) includes memory cells (M11, M12, . . . ) in each of which a variable resistance element (R11, R12, . . . ) including a variable resistance layer placed between and in contact with a first electrode and a second electrode, and a current steering element (D11, D12, . . . ) including a current steering layer placed between and in contact with a third electrode and a fourth electrode, are connected in series, and the device is driven by a first LR drive circuit (105a1) via a current limit circuit (105b) to decrease resistance of the variable resistance element while the device is driven by a second HR drive circuit (105a2) to increase resistance of the variable resistance element, thus using the current limit circuit (105b) to make a current for decreasing resistance of the variable resistance element lower than a current for increasing resistance of the variable resistance element.
Public/Granted literature
- US20110122680A1 VARIABLE RESISTANCE NONVOLATILE MEMORY DEVICE Public/Granted day:2011-05-26
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