Invention Grant
- Patent Title: Semiconductor memory device and method for testing the same
- Patent Title (中): 半导体存储器件及其测试方法
-
Application No.: US12828019Application Date: 2010-06-30
-
Publication No.: US08441846B2Publication Date: 2013-05-14
- Inventor: Kyu Sung Kim
- Applicant: Kyu Sung Kim
- Applicant Address: KR Icheon
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Icheon
- Priority: KR10-2010-0039250 20100428
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A semiconductor memory device includes a memory cell array configured to include a plurality of memory cells, a plurality of bit lines respectively coupled to the plurality of memory cells, a first power-supply voltage supplying circuit configured to provide a first power-supply voltage to the memory cell array through the plurality of bit lines, a second power-supply voltage supplying circuit configured to provide a second power-supply voltage to the memory cell array through the plurality of bit lines, a first address selection circuit configured to couple a bit line selected by a first selection address to the first power-supply voltage supplying circuit, and a second address selection circuit configured to couple a bit line selected by a second selection address to the second power-supply voltage supplying circuit.
Public/Granted literature
- US20110267875A1 SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR TESTING THE SAME Public/Granted day:2011-11-03
Information query