Invention Grant
US08441846B2 Semiconductor memory device and method for testing the same 有权
半导体存储器件及其测试方法

  • Patent Title: Semiconductor memory device and method for testing the same
  • Patent Title (中): 半导体存储器件及其测试方法
  • Application No.: US12828019
    Application Date: 2010-06-30
  • Publication No.: US08441846B2
    Publication Date: 2013-05-14
  • Inventor: Kyu Sung Kim
  • Applicant: Kyu Sung Kim
  • Applicant Address: KR Icheon
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Icheon
  • Priority: KR10-2010-0039250 20100428
  • Main IPC: G11C11/00
  • IPC: G11C11/00
Semiconductor memory device and method for testing the same
Abstract:
A semiconductor memory device includes a memory cell array configured to include a plurality of memory cells, a plurality of bit lines respectively coupled to the plurality of memory cells, a first power-supply voltage supplying circuit configured to provide a first power-supply voltage to the memory cell array through the plurality of bit lines, a second power-supply voltage supplying circuit configured to provide a second power-supply voltage to the memory cell array through the plurality of bit lines, a first address selection circuit configured to couple a bit line selected by a first selection address to the first power-supply voltage supplying circuit, and a second address selection circuit configured to couple a bit line selected by a second selection address to the second power-supply voltage supplying circuit.
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