Invention Grant
US08441861B2 Self-check calibration of program or erase and verify process using memory cell distribution
有权
自检校准程序或擦除并验证使用存储单元分配的过程
- Patent Title: Self-check calibration of program or erase and verify process using memory cell distribution
- Patent Title (中): 自检校准程序或擦除并验证使用存储单元分配的过程
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Application No.: US13049717Application Date: 2011-03-16
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Publication No.: US08441861B2Publication Date: 2013-05-14
- Inventor: Alessio Spessot , Paolo Fantini
- Applicant: Alessio Spessot , Paolo Fantini
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Knobbe Martens Olson & Bear LLP
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/06
Abstract:
Apparatus and methods determine a program verify (PV) induced reading parameter distribution. A measured post-PV reading parameter distribution can be compared with an expected post-PV reading parameter distribution. For example, de-convolution can be applied to identify the PV induced reading parameter distribution. Based on the PV-induced reading parameter distribution, adjustments can be made to one or more parameters of the PV process.
Public/Granted literature
- US20120236653A1 SELF-CHECK CALIBRATION OF PROGRAM OR ERASE AND VERIFY PROCESS USING MEMORY CELL DISTRIBUTION Public/Granted day:2012-09-20
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