Invention Grant
US08441867B2 Circuit and method for generating pumping voltage in semiconductor memory apparatus and semiconductor memory apparatus using the same 有权
用于在半导体存储装置中产生泵浦电压的电路和方法以及使用其的半导体存储装置

  • Patent Title: Circuit and method for generating pumping voltage in semiconductor memory apparatus and semiconductor memory apparatus using the same
  • Patent Title (中): 用于在半导体存储装置中产生泵浦电压的电路和方法以及使用其的半导体存储装置
  • Application No.: US13270175
    Application Date: 2011-10-10
  • Publication No.: US08441867B2
    Publication Date: 2013-05-14
  • Inventor: Jae-Kwan Kwon
  • Applicant: Jae-Kwan Kwon
  • Applicant Address: KR
  • Assignee: SK hynix Inc.
  • Current Assignee: SK hynix Inc.
  • Current Assignee Address: KR
  • Agency: Baker & McKenzie LLP
  • Priority: KR10-2008-0043022 20080508
  • Main IPC: G11C5/14
  • IPC: G11C5/14
Circuit and method for generating pumping voltage in semiconductor memory apparatus and semiconductor memory apparatus using the same
Abstract:
A circuit for generating a pumping voltage in a semiconductor memory apparatus includes a control signal generation block configured to generate a first control signal obtained by level-shifting a voltage level of a test signal to a first driving voltage level, a voltage application section configured to supply an external voltage to a first node in response to a first transmission signal, a first charge pump configured to raise a voltage level of the first node by a first predetermined level in response to an oscillator signal, and a first pumping voltage output section configured to select at least one of a first connection unit and a second connection unit in response to the first control signal, and to interconnect the first node with a second node using the selected connection unit when a second transmission signal is enabled, wherein a first pumping voltage is output through the second node.
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