Invention Grant
US08442297B2 Methods of evaluating the quality of two-dimensional matrix dot-peened marks on objects and mark verification systems 有权
评估对象和标记验证系统上二维矩阵点阵标记质量的方法

  • Patent Title: Methods of evaluating the quality of two-dimensional matrix dot-peened marks on objects and mark verification systems
  • Patent Title (中): 评估对象和标记验证系统上二维矩阵点阵标记质量的方法
  • Application No.: US12710750
    Application Date: 2010-02-23
  • Publication No.: US08442297B2
    Publication Date: 2013-05-14
  • Inventor: Roger K. TylerRonald D. Fowler
  • Applicant: Roger K. TylerRonald D. Fowler
  • Applicant Address: US MD Annapolis
  • Assignee: Arinc Incorporated
  • Current Assignee: Arinc Incorporated
  • Current Assignee Address: US MD Annapolis
  • Agency: Prass LLP
  • Agent Ronald E. Prass, Jr.
  • Main IPC: G06K9/00
  • IPC: G06K9/00
Methods of evaluating the quality of two-dimensional matrix dot-peened marks on objects and mark verification systems
Abstract:
Methods and mark verification systems for evaluating the quality of a two-dimensional matrix dot peen mark on an object are provided. An exemplary embodiment of the methods includes scanning a two-dimensional matrix dot peen mark disposed on a surface of an object with a laser displacement sensor to generate three-dimensional scanned data for the mark, the mark including a plurality of dots disposed in a plurality of rows and columns on the surface; and determining whether the mark passes a verification test based on the scanned data.
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