Invention Grant
- Patent Title: Methods of evaluating the quality of two-dimensional matrix dot-peened marks on objects and mark verification systems
- Patent Title (中): 评估对象和标记验证系统上二维矩阵点阵标记质量的方法
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Application No.: US12710750Application Date: 2010-02-23
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Publication No.: US08442297B2Publication Date: 2013-05-14
- Inventor: Roger K. Tyler , Ronald D. Fowler
- Applicant: Roger K. Tyler , Ronald D. Fowler
- Applicant Address: US MD Annapolis
- Assignee: Arinc Incorporated
- Current Assignee: Arinc Incorporated
- Current Assignee Address: US MD Annapolis
- Agency: Prass LLP
- Agent Ronald E. Prass, Jr.
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
Methods and mark verification systems for evaluating the quality of a two-dimensional matrix dot peen mark on an object are provided. An exemplary embodiment of the methods includes scanning a two-dimensional matrix dot peen mark disposed on a surface of an object with a laser displacement sensor to generate three-dimensional scanned data for the mark, the mark including a plurality of dots disposed in a plurality of rows and columns on the surface; and determining whether the mark passes a verification test based on the scanned data.
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