Invention Grant
- Patent Title: Method for generating alignment marks
- Patent Title (中): 产生对准标记的方法
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Application No.: US12619951Application Date: 2009-11-17
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Publication No.: US08442352B2Publication Date: 2013-05-14
- Inventor: Brendon Yenson , Scott Alexander Rudkin
- Applicant: Brendon Yenson , Scott Alexander Rudkin
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method (100), an apparatus (1100), and a computer program product are disclosed for generating alignment marks. A basis pattern (120) and a high frequency component (130) are combined (140). The basis pattern is defined such that a scaled and rotated version of the basis pattern correlated with the basis pattern is substantially equal to the auto-correlation of the basis pattern within a complex multiplicative constant. The high frequency component is of sufficient energy for cross correlation without detriment to the basis pattern. The basis pattern may be generated from a basis function, which may be a logarithmic radial harmonic function (LRHF). The combination is output as at least one alignment mark having an increased maximum frequency. The method (100) may further comprise printing the at least one alignment mark on a print medium.
Public/Granted literature
- US20100149555A1 Method For Generating Alignment Marks Public/Granted day:2010-06-17
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