Invention Grant
US08442788B2 Measuring device, test device, electronic device, measuring method, program, and recording medium
失效
测量装置,测试装置,电子装置,测量方法,程序和记录介质
- Patent Title: Measuring device, test device, electronic device, measuring method, program, and recording medium
- Patent Title (中): 测量装置,测试装置,电子装置,测量方法,程序和记录介质
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Application No.: US12198105Application Date: 2008-08-25
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Publication No.: US08442788B2Publication Date: 2013-05-14
- Inventor: Harry Hou , Takahiro Yamaguchi
- Applicant: Harry Hou , Takahiro Yamaguchi
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Jianq Chyun IP Office
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
Provided is a measurement apparatus that measures a signal under measurement, including a strobe timing generator that sequentially generates strobes arranged at substantially equal time intervals; a level comparing section that detects a signal level of the signal under measurement at a timing of each sequentially provided strobe; a capture memory that stores therein a data sequence of the signal levels sequentially detected by the level comparing section; a window function multiplying section that multiplies the data sequence by a window function; a frequency domain converting section that converts the data sequence multiplied by the window function into a spectrum in the frequency domain; and an instantaneous phase noise calculating section that calculates instantaneous phase noise on a time axis of the signal under measurement, based on the spectrum.
Public/Granted literature
- US20100048142A1 MEASURING DEVICE, TEST DEVICE, ELECTRONIC DEVICE, MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM Public/Granted day:2010-02-25
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