Invention Grant
- Patent Title: Method and device for determining a frequency mask for a frequency spectrum
- Patent Title (中): 用于确定频谱的频率掩模的方法和装置
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Application No.: US12967881Application Date: 2010-12-14
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Publication No.: US08442789B2Publication Date: 2013-05-14
- Inventor: Hagen Eckert , Jochen Pliquett
- Applicant: Hagen Eckert , Jochen Pliquett
- Applicant Address: DE München
- Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee Address: DE München
- Agency: Marshall, Gerstein & Borun LLP
- Priority: DE102009058741 20091217; DE102010020910 20100518
- Main IPC: G01R23/16
- IPC: G01R23/16 ; G06F19/00

Abstract:
A method and a device for determining a frequency mask disposed above or below a frequency spectrum of a detected signal determines every individual ordinate value of a first envelope curve disposed completely above or below the frequency spectrum as the maximum value or minimum value of a given number of respectively adjacent ordinate values of the frequency spectrum linked to a window function. Following this, each individual ordinate value of a second envelope curve disposed completely above or below the frequency spectrum and completely above or below the first envelope curve is determined as the maximum value or minimum value of a given number of respectively adjacent ordinate values of the frequency spectrum linked to a window function. Finally, a minimum number of ordinate values of the frequency mask from ordinate values of the first and/or second envelope curve disposed completely between the first and second envelope curve is determined, wherein in each case two successive ordinate values of the frequency mask with a maximum horizontal spacing distance within the first and second envelope curve can be reached in a linear manner relative to one another.
Public/Granted literature
- US20110153247A1 Method and Device for Determining a Frequency Mask for a Frequency Spectrum Public/Granted day:2011-06-23
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