Invention Grant
- Patent Title: Test apparatus for testing an information processing apparatus
- Patent Title (中): 用于测试信息处理装置的测试装置
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Application No.: US12409471Application Date: 2009-03-23
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Publication No.: US08443236B2Publication Date: 2013-05-14
- Inventor: Toshihisa Anbai
- Applicant: Toshihisa Anbai
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2008-076390 20080324
- Main IPC: G06F11/00
- IPC: G06F11/00
Abstract:
A test apparatus for testing an information processing apparatus includes a control unit connected to the control signal line through the connector unit to receive command information from the processing unit to execute the program, and a switching unit connected to the control unit to connect the second communication signal line and the fourth communication signal line under the control of the control unit.
Public/Granted literature
- US08332692B2 Test apparatus for testing an information processing apparatus Public/Granted day:2012-12-11
Information query
