Invention Grant
- Patent Title: High temperature sheet handling system and methods
- Patent Title (中): 高温片处理系统及方法
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Application No.: US12256865Application Date: 2008-10-23
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Publication No.: US08443863B2Publication Date: 2013-05-21
- Inventor: Michael Yoshiya Nishimoto , William Edward Lock
- Applicant: Michael Yoshiya Nishimoto , William Edward Lock
- Applicant Address: US NY Corning
- Assignee: Corning Incorporated
- Current Assignee: Corning Incorporated
- Current Assignee Address: US NY Corning
- Agent Bruce P. Watson
- Main IPC: B32B38/10
- IPC: B32B38/10

Abstract:
Methods and apparatus provide for imparting a controlled supply of gas to at least one Bernoulli chuck to provide a balanced draw and repellant gas flow to a material sheet; and at least one of: elevating a temperature of the supply of gas to the at least one Bernoulli chuck such that the gas flow to the material sheet is provided at the elevated temperature providing a stream of gas to an insulator substrate to promote separation of an exfoliation layer from a donor semiconductor wafer, and providing a stream of gas to a junction of the insulator substrate and any support structure to promote separation of the insulator substrate and the supporting structure.
Public/Granted literature
- US20100104402A1 HIGH TEMPERATURE SHEET HANDLING SYSTEM AND METHODS Public/Granted day:2010-04-29
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