Invention Grant
- Patent Title: Manufacturing method and manufacturing apparatus of semiconductor device
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Application No.: US13161776Application Date: 2011-06-16
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Publication No.: US08445359B2Publication Date: 2013-05-21
- Inventor: Shunpei Yamazaki , Koichiro Tanaka
- Applicant: Shunpei Yamazaki , Koichiro Tanaka
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2007-212679 20070817
- Main IPC: H01L21/30
- IPC: H01L21/30 ; H01L21/46 ; H01L29/30

Abstract:
To provide a manufacturing method of a semiconductor device using an SOI substrate, by which mobility can be improved. A plurality of semiconductor films formed using a plurality of bond substrates (semiconductor substrates) are bonded to one base substrate (support substrate). At least one of the plurality of bond substrates has a crystal plane orientation different from that of the other bond substrates. Accordingly, at least one of the plurality of semiconductor films formed over one base substrate has a crystal plane orientation different from that of the other semiconductor films. The crystal plane orientation of the semiconductor film is determined in accordance with the polarity of a semiconductor element formed using the semiconductor film. For example, an n-channel element in which electrons are majority carriers is formed using a semiconductor film having a face {100}, and a p-channel element in which holes are majority carriers is formed using a semiconductor film having a face {110}.
Public/Granted literature
- US20110245958A1 MANUFACTURING METHOD AND MANUFACTURING APPARATUS OF SEMICONDUCTOR DEVICE Public/Granted day:2011-10-06
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