Invention Grant
- Patent Title: Semiconductor having a high aspect ratio via
- Patent Title (中): 具有高纵横比的半导体
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Application No.: US13481550Application Date: 2012-05-25
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Publication No.: US08445380B2Publication Date: 2013-05-21
- Inventor: Yuan-Chih Hsieh , Richard Chu , Ming-Tung Wu , Martin Liu , Lan-Lin Chao , Chia-Shiung Tsai
- Applicant: Yuan-Chih Hsieh , Richard Chu , Ming-Tung Wu , Martin Liu , Lan-Lin Chao , Chia-Shiung Tsai
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L21/44
- IPC: H01L21/44

Abstract:
The present disclosure provides various embodiments of a via structure and method of manufacturing same. In an example, a method for forming a via structure includes forming a via in a semiconductor substrate, wherein via sidewalls of the via are defined by the semiconductor substrate; forming a dielectric layer on the via sidewalls; removing the dielectric layer from a portion of the via sidewalls; and forming a conductive layer to fill the via, wherein the conductive layer is disposed over the dielectric layer and the portion of the via sidewalls. In an example, the dielectric layer is an oxide layer.
Public/Granted literature
- US20120238091A1 SEMICONDUCTOR HAVING A HIGH ASPECT RATIO VIA Public/Granted day:2012-09-20
Information query
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