Invention Grant
- Patent Title: Quadrupole mass spectrometer
- Patent Title (中): 四极质谱仪
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Application No.: US12160963Application Date: 2006-06-15
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Publication No.: US08445844B2Publication Date: 2013-05-21
- Inventor: Kazuo Mukaibatake , Shiro Mizutani , Shuichi Kawana
- Applicant: Kazuo Mukaibatake , Shiro Mizutani , Shuichi Kawana
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Sughrue Mion, PLLC
- Priority: JP2006-012600 20060120
- International Application: PCT/JP2006/312024 WO 20060615
- International Announcement: WO2007/083403 WO 20070726
- Main IPC: H01J49/42
- IPC: H01J49/42

Abstract:
A table (21) for relating an appropriate DC bias voltage to each of a plurality of selectable scan speeds is stored beforehand in an auto-tuning data memory section (20). In an auto-tuning operation, a controller (10) determines the DC bias voltage corresponding to each scan speed by referring to the table (21) and fixes the output of an ion-drawing voltage generator (13) at that voltage. Subsequently, while changing the voltages applied to relevant sections such as an ion optical system (2), the controller (10) finds voltage conditions under which the detection signal is maximized. The conditions thus found are stored in an auto-tuning result data (22). In an analysis of a target sample, a DC bias voltage corresponding to a scan speed specified by an operator is obtained from the DC bias voltage table (21), and the optimal conditions for this voltage are obtained from the auto-tuning result data (22). Based on these items of information, conditions for the scan measurement are determined. This method prevents the deterioration in detection sensitivity, which will otherwise take place if the scan measurement is performed at a high scan speed.
Public/Granted literature
- US20100193684A1 QUADRUPOLE MASS SPECTROMETER Public/Granted day:2010-08-05
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