Invention Grant
US08445969B2 High pressure deuterium treatment for semiconductor/high-K insulator interface
有权
用于半导体/高K绝缘子接口的高压氘处理
- Patent Title: High pressure deuterium treatment for semiconductor/high-K insulator interface
- Patent Title (中): 用于半导体/高K绝缘子接口的高压氘处理
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Application No.: US13094873Application Date: 2011-04-27
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Publication No.: US08445969B2Publication Date: 2013-05-21
- Inventor: Xiangdong Chen , Laegu Kang , Weipeng Li , Dae-Gyu Park , Melanie J. Sherony
- Applicant: Xiangdong Chen , Laegu Kang , Weipeng Li , Dae-Gyu Park , Melanie J. Sherony
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agency: Hamilton & Terrile, LLP
- Agent Michael Rocco Cannatti
- Main IPC: H01L27/092
- IPC: H01L27/092 ; H01L21/8238

Abstract:
An integrated circuit structure comprises at least one pair of complementary transistors on a substrate. The pair of complementary transistors includes a first transistor and a second transistor. In addition, only one stress-producing layer is on the first transistor and the second transistor and applies tensile strain force on the first transistor and the second transistor. The first transistor has a first channel region, a gate insulator on the first channel region, and a deuterium region between the first channel region and the gate insulator. The second transistor has a germanium doped channel region, as well as the same gate insulator on the germanium doped channel region, and the same deuterium region between the germanium doped channel region and the gate insulator.
Public/Granted literature
- US20120273894A1 HIGH PRESSURE DEUTERIUM TREATMENT FOR SEMICONDUCTOR/HIGH-K INSULATOR INTERFACE Public/Granted day:2012-11-01
Information query
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