Invention Grant
- Patent Title: Frequency characteristics measuring device
- Patent Title (中): 频率特性测量装置
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Application No.: US12745685Application Date: 2008-12-15
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Publication No.: US08446144B2Publication Date: 2013-05-21
- Inventor: Shinji Kuniie , Satoru Aoyama , Yoshimasa Ogino
- Applicant: Shinji Kuniie , Satoru Aoyama , Yoshimasa Ogino
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: patenttm.us
- Priority: JP2007-328323 20071220
- International Application: PCT/JP2008/072741 WO 20081215
- International Announcement: WO2009/081780 WO 20090702
- Main IPC: G01R13/00
- IPC: G01R13/00 ; H04R29/00

Abstract:
It is possible to provide a frequency characteristics measuring device which can simplify the configuration for performing a measurement and reduce the undue effort required for the measurement.A spectrum analyzer (10) includes: two sets of measuring units having mixers (110, 210), local oscillators (112, 212), and IF sections (120, 220) for separately measuring frequency characteristics of two input signals; a trigger generation section (310) which generates a trigger signal for specifying a measurement start timing in each of the two sets of measuring units; a sweep control section (300) which simultaneously sends an instruction to the two local oscillators (112, 212) when a trigger signal is inputted and performs a sweep control so that the two local oscillators (112, 212) output local oscillation signals of the same frequency at the same timing.
Public/Granted literature
- US20100259245A1 FREQUENCY CHARACTERISTICS MEASURING DEVICE Public/Granted day:2010-10-14
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