Invention Grant
US08446157B2 Capacitance meter, method, computer program and computer program product for improved capacitance measurement
有权
电容表，方法，计算机程序和计算机程序产品，用于改进电容测量
- Patent Title: Capacitance meter, method, computer program and computer program product for improved capacitance measurement
- Patent Title (中): 电容表，方法，计算机程序和计算机程序产品，用于改进电容测量
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Application No.: US12884346Application Date: 2010-09-17
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Publication No.: US08446157B2Publication Date: 2013-05-21
- Inventor: Hans Olof Fröjd
- Applicant: Hans Olof Fröjd
- Applicant Address: CH Zürich
- Assignee: ABB Technology AG
- Current Assignee: ABB Technology AG
- Current Assignee Address: CH Zürich
- Agency: Venable LLP
- Agent Eric J. Franklin
- Priority: EP09170653 20090918
- Main IPC: G01R27/26
- IPC: G01R27/26
Abstract:
A capacitance meter including an AC source providing a measurement voltage with a measurement frequency to a capacitor. A current sensor is arranged to measure a current going to or from the capacitance meter. A voltage sensor is arranged to measure a voltage over the capacitor. A capacitance calculation unit is arranged to calculate, using a controller, a capacitance of the capacitor using a measured current from the current sensor, a measured voltage from the voltage sensor and the measurement frequency. The capacitance meter is arranged to obtain measurements using the current sensor and the voltage sensor during a measurement duration. The measurement frequency and the measurement duration are selected such that the measurement duration equals a multiple of the period of the measurement frequency, and the measurement duration equals a multiple of the period of a mains electricity.
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