Invention Grant
US08446937B1 Technique for the measurement of I/Q impairments associated with a sampled complex signal
有权
用于测量与采样复信号相关的I / Q损伤的技术
- Patent Title: Technique for the measurement of I/Q impairments associated with a sampled complex signal
- Patent Title (中): 用于测量与采样复信号相关的I / Q损伤的技术
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Application No.: US13442456Application Date: 2012-04-09
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Publication No.: US08446937B1Publication Date: 2013-05-21
- Inventor: Stephen L. Dark , Christopher J. Behnke
- Applicant: Stephen L. Dark , Christopher J. Behnke
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Mark K. Brightwell
- Main IPC: H04B3/46
- IPC: H04B3/46 ; H04B17/00 ; H04Q1/20

Abstract:
Systems and methods for measuring transmitter and/or receiver I/Q impairments are disclosed, including iterative methods for measuring transmitter I/Q impairments using shared local oscillators, iterative methods for measuring transmitter I/Q impairments using intentionally-offset local oscillators, and methods for measuring receiver I/Q impairments. Also disclosed are methods for computing I/Q impairments from a sampled complex signal, methods for computing DC properties of a signal path between the transmitter and receiver, and methods for transforming I/Q impairments through a linear system.
Information query