Invention Grant
- Patent Title: Radiation inspection apparatus
- Patent Title (中): 辐射检查仪
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Application No.: US12834537Application Date: 2010-07-12
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Publication No.: US08447012B2Publication Date: 2013-05-21
- Inventor: Yasushi Ichizawa , Hirohiko Obinata
- Applicant: Yasushi Ichizawa , Hirohiko Obinata
- Applicant Address: JP Tokyo
- Assignee: Yokogawa Electric Corporation
- Current Assignee: Yokogawa Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2009-167875 20090716
- Main IPC: H05G1/52
- IPC: H05G1/52

Abstract:
A radiation inspection apparatus includes a radiation source, a measurement radiation detecting unit being a rectangle having a long side, and a reference radiation detecting unit that is disposed between the radiation source and an inspection target, the reference radiation detecting unit being disposed near a path of a radiation from the radiation source to the measurement radiation detecting unit not to interrupt the radiation from the radiation source to the measurement radiation detecting unit. An intensity of the radiation source are corrected by calculating a change value of the intensity and the intensity distribution from an output of the reference radiation detecting unit and by correcting the output of the measurement radiation detecting unit based on the change value.
Public/Granted literature
- US20110013748A1 RADIATION INSPECTION APPARATUS Public/Granted day:2011-01-20
Information query
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