Invention Grant
US08447526B2 Methods and computer systems for analyzing high-throughput assays
失效
用于分析高通量测定的方法和计算机系统
- Patent Title: Methods and computer systems for analyzing high-throughput assays
- Patent Title (中): 用于分析高通量测定的方法和计算机系统
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Application No.: US11440195Application Date: 2006-05-23
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Publication No.: US08447526B2Publication Date: 2013-05-21
- Inventor: Lee Weng , Hongyue Dai , Steven R. Bartz
- Applicant: Lee Weng , Hongyue Dai , Steven R. Bartz
- Applicant Address: US WA Redmond
- Assignee: Microsoft Corporation
- Current Assignee: Microsoft Corporation
- Current Assignee Address: US WA Redmond
- Agency: Klarquist Sparkman, LLP
- Main IPC: G01N33/48
- IPC: G01N33/48 ; G01N31/00 ; G06G7/48 ; G06G7/58

Abstract:
The present invention provides methods and computer programs for detecting variations in measurements of a biological variable, e.g., variations in cell viability, under different conditions, e.g., with or without treatment of a drug, under the treatments of different drugs, or under different environmental conditions. The methods and programs of the invention determine a metric of difference between measurements under different condition, and make use of predetermined errors of the measurements, e.g., errors determined from an error model, to estimate the errors in the metric of difference. Such an approach provides a more accurate estimate of the errors of measurements, which, in turn, provides a more accurate estimate of the error of the difference metric.
Public/Granted literature
- US20070015135A1 Methods and computer systems for analyzing high-throughput assays Public/Granted day:2007-01-18
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