Methods and systems using one or more expert systems to increase electronic device reliability. One embodiment is a method to screen an electronic device by one or more expert systems to detect a potential failure of the electronic device, selectively testing the electronic device when the screening indicates a potential failure, and providing one or more outputs if the selective testing of the electronic device indicates a failure. A second embodiment is a system to screen an electronic device by one or more expert systems to detect a potential failure, selectively testing the electronic device when the screening indicates a potential failure and providing one or more outputs if the selective testing of the electronic device indicates the failure.